Phase Delay in MAC-based Analog Functional Testing in Mixed-Signal Systems
نویسندگان
چکیده
A Built-In Self-Test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixedsignal systems when using MAC-based ORAs. We show that phase delay has a critical impact on the measurement results and that the MAC-based ORA is an effective method for measuring phase delay.
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تاریخ انتشار 2006